Current Applied Physics :eISSN 1567-1739 / pISSN 1567-1739

Download to citation(s)
N.d. C, L.t. V, H.t. HT, H. SC.  Influence of hetero-gate dielectrics on short-channel effects in scaled tunnel field-effect transistors.  CAP 2020;20:1342-1350.  https://doi.org/10.1016/j.cap.2020.09.004
* Please select a format and type blew.
Export type
Format